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Your search returned 14 records. Click on the hyperlinks to view further details of Titles.. |
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Magazine Name : Ieee Transactions On Reliability
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Year : 2002 Volume number : 51 Issue: 04 |
Interaction Of Interface-Traps Located At Various Sites In Mosfets Under Stress
(Article)
Subject:
Annealing
,
Hot Carrier
,
Mosfet
,
Semiconductor Device Reliability
Author:
Gang
Chen
M. F
Li
page:
387
-
391
Error Detection By Selective Procedure Call Duplication For Low Energy Consumption
(Article)
Subject:
Fault Tolerance
,
Instruction Duplication
,
Low Energy Technique
,
Low Power Technique
Author:
Nahmsuk
Oh
Edward J.
Mccluskey
page:
392
-
402
Electromigration Reliability Issues In Dual-Damascene Cu Interconnections
(Article)
Subject:
Blech Effect
,
Critical Length Effect
,
Cu Interconnects
,
Dual-Damascene Cu
Author:
Paul S.
Ho
Volker A.
Blaschke
Ki-Don
Lee
Ennis T.
Ogawa
page:
403
-
419
Software Reliability Growth With Test Coverage
(Article)
Subject:
Defect Density
,
Reliability Growth
,
Software Reliability
,
Software Testing
Author:
Yashwant K.
Malaiya
Michael
Li
James M.
Bieman
page:
420
-
426
An Optimal Designed Degradation Experiment For Reliability Improvement
(Article)
Subject:
Degradation Data
,
Design Of Experiments
,
Inspection Frequency
,
Termination Time
Author:
Hong-Fwu
Yu
Chih-Hua
Chiao
page:
427
-
433
A Nonparametric Nonstationary Procedure For Failure Prediction
(Article)
Subject:
Software Reliability Growth Model
,
Predictive Validity
,
Non-Parametric
,
Non-Stationary Procedure
Author:
Jonas D.
Pfefferman
Bruno
Cernuschi-Frias
page:
434
-
442
Obdd-Based Evaluation Of K-Terminal Network Reliability
(Article)
Subject:
Network Reduction Technique
,
Network Reliability
,
Terminal-Pair Reliability (Tr)
,
Ordered Binary Decision Diagram (Obdd)
Author:
Fu-Min
Yeh
Shyue-Kung
Lu
Sy-Yen
Kuo
page:
443
-
451
Closure Property Of The Nbuc Class Under Formation Of Parallel Systems
(Article)
Subject:
Nbu
,
Parallel System
,
Series System
,
Stochastic Order
Author:
Kyriakos I.
Petakos
Franco
Pellerey
page:
452
-
454
Using Regression Trees To Classify Fault-Prone Software Modules
(Article)
Subject:
Classification
,
Fault-Prone Programs
,
Regression Trees.
,
Software Metrics
Author:
Taghi M.
Khoshgoftaar
E. B
Allen
page:
455
-
462
Accelerated Degradation-Tests With Tightened Critical Values
(Article)
Subject:
Accelerated Degradation Test (Adt)
,
Critical Value
,
Performance Characteristics
,
Sensitivity Analysis
Author:
Guangbin
Yang
Kai
Yang
page:
463
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468
Practical "Building-In Reliability" Approaches For Semiconductor Manufacturing
(Article)
Subject:
Isothermal Model
,
Process Control
,
Building-In Reliability
,
Hci
Author:
Wei-Ting Kary
Chien
page:
469
-
481
Quantitative Measurement Of Channel Temperature Of Gaas Devices For Reliable Life-Time Prediction
(Article)
Subject:
Gallium Arsenide
,
Baseplate Temperature
,
Channel Temperature
,
Thermistor
Author:
Jeffrey A.
Mittereder
Jason A.
Roussos
Wallace T.
Anderson
page:
482
-
485
The Effect Of Model Uncertainty On Maintenance Optimization
(Article)
Subject:
Censored Data
,
Competing Risk
,
Copula
,
Preventive Maintenance
Author:
T.
Bedford
Cornel
Bunea
page:
486
-
493
Detecting Signal-Overshoots For Reliability Analysis In High-Speed System-On-Chips
(Article)
Subject:
Hot Carrier
,
System-On-Chip
,
High-Speed Interconnect
,
Reliability Loss
Author:
Mehrdad
Nourani
Amir R.
Attarha
page:
494
-
504
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